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140122 ||| eng |
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|a 9781475737684
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100 |
1 |
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|a van de Plassche, Rudy J.
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245 |
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|a CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters
|h Elektronische Ressource
|c by Rudy J. van de Plassche
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250 |
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|a 2nd ed. 2003
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260 |
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|a New York, NY
|b Springer US
|c 2003, 2003
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300 |
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|a XLII, 588 p
|b online resource
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505 |
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|a 1 The converter as a black box -- 2 Specifications of converters -- 3 High-speed A/D converters -- 4 High-speed D/A converters -- 5 High-resolution A/D converters -- 6 High-resolution D/A converters -- 7 Sample-and-hold amplifiers -- 8 Noise-shaping D/A conversion -- 9 Sigma-delta A/D conversion -- 10 Voltage and current references -- 11 Limitations of comparators -- 12 Technology and device matching -- 13 Testing of D/A and A/D converters
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653 |
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|a Electrical and Electronic Engineering
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653 |
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|a Electrical engineering
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653 |
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|a Electronic circuits
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653 |
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|a Signal, Speech and Image Processing
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653 |
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|a Electronic Circuits and Systems
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653 |
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|a Signal processing
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041 |
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7 |
|a eng
|2 ISO 639-2
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989 |
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|b SBA
|a Springer Book Archives -2004
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|a The Springer International Series in Engineering and Computer Science
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028 |
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|a 10.1007/978-1-4757-3768-4
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856 |
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|u https://doi.org/10.1007/978-1-4757-3768-4?nosfx=y
|x Verlag
|3 Volltext
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082 |
0 |
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|a 621.3815
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520 |
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|a CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters describes in depth converter specifications like Effective Number of Bits (ENOB), Spurious Free Dynamic Range (SFDR), Integral Non-Linearity (INL), Differential Non-Linearity (DNL) and sampling clock jitter requirements. Relations between these specifications and practical issues like matching of components and offset parameters of differential pairs are derived. CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters describes the requirements of input and signal reconstruction filtering in case a converter is applied into a signal processing system. CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters describes design details of high-speed A/D and D/A converters, high-resolution A/D and D/A converters, sample-and-hold amplifiers, voltage and current references, noise-shaping converters and sigma-delta converters, technology parameters and matching performance, comparators and limitations of comparators and finally testing of converters
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