CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters

CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters describes in depth converter specifications like Effective Number of Bits (ENOB), Spurious Free Dynamic Range (SFDR), Integral Non-Linearity (INL), Differential Non-Linearity (DNL) and sampling clock jitter requirements. Relations be...

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Bibliographic Details
Main Author: van de Plassche, Rudy J.
Format: eBook
Language:English
Published: New York, NY Springer US 2003, 2003
Edition:2nd ed. 2003
Series:The Springer International Series in Engineering and Computer Science
Subjects:
Online Access:
Collection: Springer Book Archives -2004 - Collection details see MPG.ReNa
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505 0 |a 1 The converter as a black box -- 2 Specifications of converters -- 3 High-speed A/D converters -- 4 High-speed D/A converters -- 5 High-resolution A/D converters -- 6 High-resolution D/A converters -- 7 Sample-and-hold amplifiers -- 8 Noise-shaping D/A conversion -- 9 Sigma-delta A/D conversion -- 10 Voltage and current references -- 11 Limitations of comparators -- 12 Technology and device matching -- 13 Testing of D/A and A/D converters 
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653 |a Signal processing 
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520 |a CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters describes in depth converter specifications like Effective Number of Bits (ENOB), Spurious Free Dynamic Range (SFDR), Integral Non-Linearity (INL), Differential Non-Linearity (DNL) and sampling clock jitter requirements. Relations between these specifications and practical issues like matching of components and offset parameters of differential pairs are derived. CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters describes the requirements of input and signal reconstruction filtering in case a converter is applied into a signal processing system. CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters describes design details of high-speed A/D and D/A converters, high-resolution A/D and D/A converters, sample-and-hold amplifiers, voltage and current references, noise-shaping converters and sigma-delta converters, technology parameters and matching performance, comparators and limitations of comparators and finally testing of converters