Transmission Electron Microscopy A Textbook for Materials Science
Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible di...
| Main Authors: | , |
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| Format: | eBook |
| Language: | English |
| Published: |
New York, NY
Springer US
1996, 1996
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| Edition: | 1st ed. 1996 |
| Subjects: | |
| Online Access: | |
| Collection: | Springer Book Archives -2004 - Collection details see MPG.ReNa |
Table of Contents:
- 1 The Transmission Electron Microscope
- 2 Scattering and Diffraction
- 3 Elastic Scattering
- 4 Inelastic Scattering and Beam Damage
- 5 Electron Sources
- 6 Lenses, Apertures, and Resolution
- 7 How to “See” Electrons
- 8 Pumps and Holders
- 9 The Instrument
- 10 Specimen Preparation
- 11 Diffraction Patterns
- 12 Thinking in Reciprocal Space
- 13 Diffracted Beams
- 14 Bloch Waves
- 15 Dispersion Surfaces
- 16 Diffraction from Crystals
- 17 Diffraction from Small Volumes
- 18 Indexing Diffraction Patterns
- 19 Kikuchi Diffraction
- 20 Obtaining CBED Patterns
- 21 Using Convergent-Beam Techniques
- 22 Imaging in the TEM
- 23 Thickness and Bending Effects
- 24 Planar Defects
- 25 Strain Fields
- 26 Weak-Beam Dark-Field Microscopy
- 27 Phase-Contrast Images
- 28 High-Resolution TEM
- 29 Image Simulation
- 30 Quantifying and Processing HRTEM Images
- 31 Other Imaging Techniques
- 32 X-ray Spectrometry
- 33 The XEDS-TEM Interface
- 34 Qualitative X-ray Analysis
- 35 Quantitative X-ray Microanalysis
- 36 Spatial Resolution and Minimum Detectability
- 37 Electron Energy-Loss Spectrometers
- 38 The Energy-Loss Spectrum
- 39 Microanalysis with Ionization-Loss Electrons
- 40 Everything Else in the Spectrum
- Acknowledgements for Figures