Yield Simulation for Integrated Circuits
In the summer of 1981 I was asked to consider the possibility of manufacturing a 600,000 transistor microprocessor in 1985. It was clear that the technology would only be capable of manufacturing 100,000-200,000 transistor chips with acceptable yields. The control store ROM occupied approximately ha...
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| Format: | eBook |
| Language: | English |
| Published: |
New York, NY
Springer US
1987, 1987
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| Edition: | 1st ed. 1987 |
| Series: | The Springer International Series in Engineering and Computer Science
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| Subjects: | |
| Online Access: | |
| Collection: | Springer Book Archives -2004 - Collection details see MPG.ReNa |
Table of Contents:
- 1. Introduction
- 2. Background
- 3. Defect Models
- 4. Defect Statistics
- 5. Fault Analysis
- 6. VLASIC Implementation
- 7. Redundancy Analysis System
- 8. Fabrication Data
- 9. Conclusions and Current Research
- References