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140122 ||| eng |
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|a 9781475712384
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| 100 |
1 |
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|a Teo, B. K.
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| 245 |
0 |
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|a EXAFS Spectroscopy
|h Elektronische Ressource
|b Techniques and Applications
|c by B. K. Teo, D. C. Joy
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| 250 |
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|a 1st ed. 1981
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| 260 |
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|a New York, NY
|b Springer US
|c 1981, 1981
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| 300 |
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|a VIII, 275 p. 50 illus
|b online resource
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| 505 |
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|a 1 Historical Development of EXAFS -- 2 Theory of Extended X-Ray Absorption Fine Structure -- 3 EXAFS Spectroscopy: Techniques and Applications -- 4 Understanding the Causes of Non-Transferability of EXAFS Amplitude -- 5 Near Neighbor Peak Shape Considerations in EXAFS Analysis -- 6 Disorder Effects in the EXAFS of Metals and Semiconductors in the Solid and Liquid States -- 7 Structural Studies of Supertonic Conduction -- 8 Extended X-Ray Absorption Fine Structure Studies at High Pressure -- 9 Structural Evidence for Solutions from EXAFS Measurements -- 10 EXAFS Studies of Supported Metal Catalysts -- 11 EXAFS of Amorphous Materials -- 12 EXAFS of Dilute Systems: Fluorescence Detection -- 13 EXAFS Studies of Dilute Impurities in Solids -- 14 Materials Research at Stanford Synchrotron Radiation Laboratory -- 15 Cornell High Energy Synchrotron Source: CHESS -- 16 National Synchrotron Light Source (NSLS): An Optimized Source for Synchrotron Radiation -- 17 Electron Energy Loss Spectroscopy for Extended Fine Structure Studies — An Introduction -- 18 Extended Core Edge Fine Structure in Electron Energy Loss Spectra -- 19 Extended Energy Loss Fine Structure Studies in an Electron Microscope -- 20 A Comparison of Electron and Photon Beams for Obtaining Inner Shell Spectra -- 21 Some Thoughts Concerning the Radiation Damage Resulting from Measurement of Inner Shell Excitation Spectra Using Electron and Photon Beams
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| 653 |
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|a Humanities and Social Sciences
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| 653 |
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|a Humanities
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| 653 |
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|a Spectrum analysis
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| 653 |
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|a Spectroscopy
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| 653 |
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|a Social sciences
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| 653 |
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|a Analytical chemistry
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| 653 |
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|a Analytical Chemistry
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| 700 |
1 |
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|a Joy, D. C.
|e [author]
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| 041 |
0 |
7 |
|a eng
|2 ISO 639-2
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| 989 |
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|b SBA
|a Springer Book Archives -2004
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| 028 |
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|a 10.1007/978-1-4757-1238-4
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| 856 |
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|u https://doi.org/10.1007/978-1-4757-1238-4?nosfx=y
|x Verlag
|3 Volltext
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| 082 |
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|a 543
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| 520 |
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|a This book on Extended X-Ray Absorption Fine Structure (EXAFS) Spectroscopy grew out of a symposium, with the same title, organized by us at the 1979 Meeting of the Materials Research Society (MRS) in Boston, MA. That meeting provided not only an overview of the theory, instrumentation and practice of EXAFS Spectroscopy as currently employed with photon beams, but also a forum for a valuable dialogue between those using the conventional approach and those breaking fresh ground by using electron energy loss spectroscopy (EELS) for EXAFS studies. This book contains contributions from both of these groups and provides the interested reader with a detailed treatment of all aspects of EXAFS spectroscopy, from the theory, through consideration of the instrumentation for both photon and electron beam purposes, to detailed descriptions of the applications and physical limitations of these techniques. While some of the material was originally presented at the MRS meeting all of the chapters have been specially written for this book and contain much that is new and significant
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