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01392nmm a2200277 u 4500 |
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EBX01000000000000000483341 |
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140122 ||| eng |
| 020 |
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|a 9781468490695
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| 100 |
1 |
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|a Vavilov, V. S.
|e [editor]
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| 245 |
0 |
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|a Radiation Effects in Semiconductors and Semiconductor Devices
|h Elektronische Ressource
|c edited by V. S. Vavilov
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| 250 |
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|a 1st ed. 1977
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| 260 |
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|a New York, NY
|b Springer US
|c 1977, 1977
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| 300 |
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|a 280 p. 98 illus
|b online resource
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| 505 |
0 |
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|a one -- I The Theory of the Formation and Nature of Radiation-Induced Defects -- II Experimental Study of Radiation Defects in Semiconductors and Control of Semiconductor Properties by Irradiation -- III Ionization in Semiconductors as a Result of the Stopping of Charged Particles, Absorption and Scattering of Photons -- Two -- I Radiation Effects in Transistors -- II Radiation Effects in Semiconductor Diodes -- III Effect of Pulsed Radiation on Semiconductor Devices
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| 653 |
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|a Spectrum analysis
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| 653 |
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|a Condensed Matter Physics
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| 653 |
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|a Spectroscopy
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| 653 |
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|a Condensed matter
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| 041 |
0 |
7 |
|a eng
|2 ISO 639-2
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| 989 |
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|b SBA
|a Springer Book Archives -2004
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| 028 |
5 |
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|a 10.1007/978-1-4684-9069-5
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| 856 |
4 |
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|u https://doi.org/10.1007/978-1-4684-9069-5?nosfx=y
|x Verlag
|3 Volltext
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| 082 |
0 |
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|a 530.41
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