Surface and Interface Characterization by Electron Optical Methods
The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and...
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| Format: | eBook |
| Language: | English |
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New York, NY
Springer US
1988, 1988
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| Edition: | 1st ed. 1988 |
| Series: | Nato ASI Subseries B:, Physics
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| Subjects: | |
| Online Access: | |
| Collection: | Springer Book Archives -2004 - Collection details see MPG.ReNa |
Table of Contents:
- Principles and techniques of transmission imaging of surfaces
- Catalyst studies by scanning transmission electron microscopy
- Localised surface imaging and spectroscopy in the scanning transmission electron microscope
- Fundamentals of high resolution transmission electron microscopy
- Profile imaging of small particles, extended surfaces and dynamic surface phenomena
- Transmission electron microscopy and diffraction from semiconductor interfaces and surfaces
- The transmission electron microscopy of interfaces and multilayers
- Surface microanalysis and microscopy by X-ray photoelectron spectroscopy (XPS), core-loss spectroscopy (CLS) and Auger electron spectroscopy (AES)
- Reflection electron microscopy
- An introduction to reflection high energy electron diffraction
- Intensity oscillations in reflection high energy electron diffraction during epitaxial growth
- Emission and low energy reflection electron microscopy
- Scanning tunneling microscopy and spectroscopy
- Spin-polarized secondary electrons from ferromagnets
- Electronically stimulated desorption: mechanisms, applications and implications
- Structure and catalytic activity of surfaces