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Advances in Acoustic Microscopy Volume 2

This is the second volume of Advances in Acoustic Microscopy. It continues the aim of presenting applications and developments of techniques that are related to high-resolution acoustic imaging. We are very grateful to the authors who have devoted considerable time to preparing these chapters, each...

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Bibliographic Details
Other Authors: Briggs, Andrew (Editor), Arnold, Walter (Editor)
Format: eBook
Language:English
Published: New York, NY Springer US 1996, 1996
Edition:1st ed. 1996
Series:Advances in Acoustic Microscopy
Subjects:
Spectrum Analysis
Bioanalysis And Bioimaging
Condensed Matter Physics
Spectroscopy
Crystallography
Materials / Analysis
Biophysics
Characterization And Analytical Technique
Condensed Matter
Crystallography And Scattering Methods
Online Access:
Collection: Springer Book Archives -2004 - Collection details see MPG.ReNa
Table of Contents:
  • 1. Characterization of Electronic Components by Acoustic Microscopy
  • 1.1. Introduction
  • 1.2. Commonly Used Ultrasonic Microscope Equipment
  • 1.3. Failure Mechanisms Induced by Assembly-Related Problems
  • 1.4. Advantages and Limitations of Acoustic Microscopy in the Semiconductor Industry
  • 1.5. Ultrasonic Microscope Applications in the Production, Qualification, and Failure Analysis of Semiconductor Devices
  • 1.6. Conclusions
  • References
  • 2. Principles and Applications of High-Frequency Medical Imaging
  • 2.1. Introduction
  • 2.2. Historical Perspective of Echographic Concepts
  • 2.3. High-Frequency Medical Ultrasonic Systems
  • 2.4. Scanning Modes and Scanning Electronics
  • 2.5. Ultrasonic High-Frequency Imaging Transducers
  • 2.6. Dermatological Applications
  • 2.7. Ophthalmological Applications
  • 2.8. Intravascular Ultrasound Imaging
  • 2.9. Conclusion
  • References
  • 3. Interaction of Acoustic Waves with Solid Surfaces
  • 3.1. Introduction
  • 3.2. Acoustic Reflection Coefficient at a Liquid/Solid Interface
  • 3.3. Layered Materials and Guided Waves
  • 3.4. Method and Apparatus of Measurement
  • 3.5. Applications to Materials Characterization
  • 3.6. Conclusion
  • References
  • Appendixes
  • 4. Scanning Ultrasonic Microscopy with Phase Contrast
  • 4.1. The Phase-Sensitive Acoustic Microscope
  • 4.2. Topographical Measurements
  • 4.3. Lens Characterization
  • 4.4. Determination of the Elastic Properties of Small Samples
  • 4.5. Determination of Elastic Constants of Single Crystals
  • References
  • 5. Ultrasonic Focusing with Time Reversal Mirrors
  • 5.1. Introduction
  • 5.2. Principles of Time Reversal Acoustics
  • 5.3. Applications of Time Reversal Mirrors
  • 5.4. The DORT Method (Décomposition de l’Opérateur de Retournement Temporel)
  • 5.5. Conclusion
  • References

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