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Ion Spectroscopies for Surface Analysis

Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many ap­ proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directl...

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Bibliographic Details
Other Authors: Czanderna, Alvin W. (Editor), Hercules, David M. (Editor)
Format: eBook
Language:English
Published: New York, NY Springer US 1991, 1991
Edition:1st ed. 1991
Series:Methods of Surface Characterization
Subjects:
Physical Chemistry
Spectrum Analysis
Condensed Matter Physics
Spectroscopy
Analytical Chemistry
Crystallography
Condensed Matter
Crystallography And Scattering Methods
Online Access:
Collection: Springer Book Archives -2004 - Collection details see MPG.ReNa
Table of Contents:
  • Density of Large-Diameter Ion Beams for Sputter Depth Profiling of Solid Surfaces
  • Standard Guide for Specimen Handling in Auger Electron Spectroscopy, X-Ray Photoelectron Spectroscopy, and Secondary Ion Mass Spectrometry
  • Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
  • 2. Photoionization
  • 3. Experimental Details
  • 4. Artifacts, Quantitation, Capabilities, and Limitations
  • 5. Applications
  • 6. Future Directions
  • 7. Summary
  • References
  • 5. Rutherford Backscattering and Nuclear Reaction Analysis
  • 1. Introduction
  • 2. Principles of the Methods
  • 2. Apparatus
  • 4. Quantitative Analysis and Sensitivity
  • 5. Ion Scattering as a Structural Tool
  • 6. Applications
  • 7. Outstanding Strengths of RBS in Relation to AES, XPS, and SIMS
  • References
  • 6. Ion Scattering Spectroscopy
  • 1. Introduction
  • 2. Basic Principles
  • 3. Experimental Techniques
  • 4. Calculations
  • 5. Analysis of Surface Composition
  • 6. Structure of Crystalline Surfaces
  • References
  • 7. Comparison of SIMS, SNMS, ISS, RBS, AES, and XPS Methods for Surface Compositional Analysis
  • 1. Purpose
  • 2. Introduction
  • 3. Comparison Categories or Criteria
  • 4. The Surface Analysis Community
  • References
  • Standard Terminology Relating to Surface Analysis
  • 1. Overview of Ion Spectroscopies for Surface Compositional Analysis
  • Glossary of Acronyms
  • 1. Purposes
  • 2. Introduction
  • 3. Overview of Compositional Surface Analysis by Ion Spectroscopies
  • 4. Ion Spectroscopies Using Ion Stimulation
  • 5. Ion Spectroscopies Using Ion Detection
  • References
  • 2. Surface Structure and Reaction Studies by Ion-Solid Collisions
  • 1. Introduction
  • 2. The Experimental Approach
  • 3. How to View the Process
  • 4. Electronic Effects
  • 5. Surface Characterization with Ion Bombardment
  • 6. Conclusions and Prospects
  • References
  • 3. Particle-Induced Desorption Ionization Techniques for Organic Mass Spectrometry
  • 1. Introduction
  • 2. Spectral Effects of Primary Beam Parameters
  • 3. Properties of Secondary Ions
  • 4. Sample Preparation
  • 5. Special Techniques
  • 6. Future Prospects
  • References
  • 4. Laser Resonant and Nonresonant Photoionization of Sputtered Neutrals
  • Glossary of Symbols and Acronyms
  • 1. Introduction

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