Electrical Characterization of Silicon-on-Insulator Materials and Devices
Silicon on Insulator is more than a technology, more than a job, and more than a venture in microelectronics; it is something different and refreshing in device physics. This book recalls the activity and enthu siasm of our SOl groups. Many contributing students have since then disappeared from the...
Main Authors: | , |
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Format: | eBook |
Language: | English |
Published: |
New York, NY
Springer US
1995, 1995
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Edition: | 1st ed. 1995 |
Series: | The Springer International Series in Engineering and Computer Science
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Subjects: | |
Online Access: | |
Collection: | Springer Book Archives -2004 - Collection details see MPG.ReNa |
Table of Contents:
- Preface
- 1 Introduction
- 1.1 Why SOI ?
- 1.2 Why Not Yet SOI ?
- 1.3 Why an SOI Book?
- 2 Methods of Forming SOI Wafers
- 2.1 SIMOX
- 2.2 Wafer Bonding
- 2.3 Zone-Melting Recrystallization
- 2.4 Epitaxial Lateral Overgrowth
- 2.5 Full Isolation by Porous Oxidized Silicon
- 2.6 Silicon on Sapphire
- 2.7 Silicon on Zirconia
- 3 SOI Devices
- 3.1 Advanced CMOS and Bipolar Devices
- 3.2 Radiation-Hardened Circuits
- 3.3 High-Voltage Devices
- 3.4 High-Temperature Devices
- 3.5 Low-Power Applications
- 3.6 Three-Dimensional Devices
- 3.7 Transducers
- 3.8 Innovative Devices
- 4 Wafer-Screening Techniques
- 4.1 The Basis for Wafer Screening
- 4.2 Surface Photovoltage
- 4.3 Dual-Beam S-Polarized Reflectance
- 4.4 Dual-Beam Optical Modulation
- 4.5 Other Optical Methods
- 4.6 Point Contact Pseudo-MOS Transistor
- 4.7 Quick-Turnaround Capacitance
- 4.8 Pinhole Detection
- 4.9 Conclusion
- 5 Transport Measurements
- 5.1 Four-Point Probe
- 5.2 Spreading Resistance
- 5.3 Hall Effect and Magnetoresistance
- 5.4 Van der Pauw Measurements
- 5.5 Photoconductivity
- 5.6 PICTS
- 6 SIS Capacitor-Based Characterization Techniques
- 6.1 Capacitance and Conductance Techniques
- 6.2 Bias-Scan DLTS Technique
- 6.4 Zerbst Method and Generation Lifetime
- 6.5 MOS Capacitance Method
- 7 Diode Measurements
- 7.1 Current—Voltage Measurements in a P—N Diode
- 7.2 Differential Current/Capacitance Method
- 7.3 Gated-Diode Measurements
- 7.4 Deep-Level Transient Spectroscopy
- 8 Electrical Characterization of SOI Materials and Devices MOS Transistor Characteristics
- 9 Transistor-Based Characterization Techniques
- List of Symbols