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140122 ||| eng |
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|a 9781461344162
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|a Bertin, E.P.
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| 245 |
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|a Principles and Practice of X-Ray Spectrometric Analysis
|h Elektronische Ressource
|c by E.P. Bertin
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| 250 |
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|a 1st ed. 1975
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| 260 |
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|a New York, NY
|b Springer US
|c 1975, 1975
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| 300 |
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|a 1080 p
|b online resource
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| 505 |
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|a I. X-Ray Physics -- 1. Excitation and Nature of X-Rays; X-Ray Spectra -- 2. Properties of X-Rays -- II. The X-Ray Spectrometer, its Components, and their Operation -- 3. X-Ray Secondary-Emission (Fluorescence) Spectrometry; General Introduction -- 4. Excitation -- 5. Dispersion -- 6. Detection -- 7. Measurement -- 8. Pulse-Height Selection; Energy-Dispersive Analysis; Nondispersive Analysis -- 9. Laboratory, Automated, and Special X-Ray Spectrometers -- III. Qualitative and Semiquantitative Analysis -- 10. Qualitative and Semiquantitative Analysis -- IV. Performance Criteria and other Features -- 11. Precision and Error; Counting Statistics -- 12. Matrix Effects -- 13. Sensitivity and Resolution; Spectral-Line Interference -- V. Quantitative Analysis -- 14. Methods of Quantitative Analysis -- 15. Mathematical Correction of Absorption-Enhancement Effects -- VI. Specimen Preparation and Presentation --
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|a Appendix 5. Wavelengths of the K, L, and M X-Ray Absorption Edges of the Chemical Elements -- Appendix 6. K, L, and M X-Ray Excitation Potentials of the Chemical Elements -- Appendix 7A. X-Ray Mass-Absorption Coefficients of the Chemical Elements at 0.1-30 Å -- Appendix 7B. X-Ray Mass-Absorption Coefficients of Elements 2-11 (He-Na) at 40-100 Å -- Appendix 9. Average Values of the K, L, and M Fluorescent Yields of the Chemical Elements -- Appendix 10. X-Ray Spectrometer Analyzer Crystals and Multilayer Films -- Appendix 11A. Glossary of Frequently Used Notation -- Appendix 11B. Prefixes for Physical Units -- Appendix 12. Periodic Table of the Chemical Elements -- Books -- Periodicals -- General Reviews -- Bibliographies -- Tables of Wavelengths, 2? Angles, and Mass-Absorption Coefficients -- Papers and Reports
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|a 16. Specimen Preparation and Presentation—General; Solids, Powders, Briquets, Fusion Products -- 17. Specimen Preparation and Presentation—Liquids; Supported Specimens -- VII. Unconventional Modes of Operation; Related X-Ray Methods of Analysis -- 18. Measurement of Thickness of Films and Platings -- 19. Selected-Area Analysis -- 20. Other Analytical Methods Based on Emission, Absorption, and Scatter of X-Rays; Other Spectrometric Methods Involving X-Rays -- 21. Electron-Probe Microanalysis -- VIII. Appendixes, Bibliography -- Appendixes -- Appendix 1. Wavelengths of the Principal X-Ray Spectral Lines of the Chemical Elements—K Series -- Appendix 2. Wavelengths of the Principal X-Ray Spectral Lines of the Chemical Elements—L Series -- Appendix 3. Wavelengths of the Principal X-Ray Spectral Lines of the Chemical Elements—M Series -- Appendix 4. Photon Energies of the Principal K and L X-RaySpectral Lines of the Chemical Elements --
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| 653 |
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|a Analytical chemistry
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| 653 |
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|a Electronic circuits
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| 653 |
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|a Analytical Chemistry
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| 653 |
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|a Electronic Circuits and Systems
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| 041 |
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|a eng
|2 ISO 639-2
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| 989 |
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|b SBA
|a Springer Book Archives -2004
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| 028 |
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|a 10.1007/978-1-4613-4416-2
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| 856 |
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|u https://doi.org/10.1007/978-1-4613-4416-2?nosfx=y
|x Verlag
|3 Volltext
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|a 543
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| 520 |
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|a Since the first edition of this book was published early in 1970, three major developments have occurred in the field of x-ray spectrochemical analysis. First, wavelength-dispersive spectrometry, in 1970 already securely established among instrumental analytical methods, has matured. Highly sophisticated, miniaturized, modular, solid-state circuitry has replaced elec tron-tube circuitry in the readout system. Computers are now widely used to program and control fully automated spectrometers and to store, process, and compute analytical concentrations directly and immediately from ac cumulated count data. Matrix effects have largely yielded to mathematical treatment. The problems associated with the ultralong-wavelength region have been largely surmounted. Indirect (association) methods have extended the applicability of x-ray spectrometry to the entire periodic table and even to certain classes of compounds. Modern commercial, computerized, auto matic, simultaneous x-ray spectrometers can index up to 60 specimens in turn into the measurement position and for each collect count data for up to 30 elements and read out the analytical results in 1--4 min-all corrected for absorption-enhancement and particle-size or surface-texture effects and wholly unattended. Sample preparation has long been the time-limiting step in x-ray spectrochemical analysis. Second, energy-dispersive spectrometry, in 1970 only beginning to assume its place among instrumental analytical methods, has undergone phenomenal development and application and, some believe, may supplant wavelength spectrometry for most applications in the foreseeable future
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