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Electrothermal Analysis of VLSI Systems

Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeli...

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Bibliographic Details
Main Authors: Yi-Kan Cheng, Ching-Han Tsai (Author), Chin-Chi Teng (Author), Sung-Mo (Steve) Kang (Author)
Format: eBook
Language:English
Published: New York, NY Springer US 2002, 2002
Edition:1st ed. 2002
Subjects:
Electrical And Electronic Engineering
Electrical Engineering
Electronic Circuits
Electronic Circuits And Systems
Online Access:
Collection: Springer Book Archives -2004 - Collection details see MPG.ReNa
Table of Contents:
  • The Building Blocks
  • Power Analysis for CMOS Circuits
  • Temperature-dependent MOS Device Modeling
  • Thermal Simulation for VLSI Systems
  • Fast-timing Electrothermal Simulation
  • The Applications
  • Temperature-dependent Electromigration Reliability
  • Temperature-driven Cell Placement
  • Temperature-driven Power and Timing Analysis

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