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131104 ||| eng |
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|a 9783642401282
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| 100 |
1 |
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|a Hinrichs, Karsten
|e [editor]
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| 245 |
0 |
0 |
|a Ellipsometry of Functional Organic Surfaces and Films
|h Elektronische Ressource
|c edited by Karsten Hinrichs, Klaus-Jochen Eichhorn
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| 250 |
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|a 1st ed. 2014
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| 260 |
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|a Berlin, Heidelberg
|b Springer Berlin Heidelberg
|c 2014, 2014
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| 300 |
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|a XXI, 363 p. 216 illus., 55 illus. in color
|b online resource
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| 505 |
0 |
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|a Biomolecules at surfaces -- Smart polymer surfaces and films -- Nanostructured surfaces and organic/inorganic hybrids -- Thin films of organic semiconductors for OPV, OLEDs and OTFT -- Developments in ellipsometric real-time/in-situ monitoring techniques -- Infrared brillant light sources for micro-ellipsometric studies of organic films -- Collection of optical constants of organic layers
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| 653 |
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|a Surface and Interface and Thin Film
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| 653 |
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|a Laser
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| 653 |
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|a Physical chemistry
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| 653 |
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|a Thin films
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| 653 |
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|a Physical Chemistry
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| 653 |
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|a Surfaces, Interfaces and Thin Film
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| 653 |
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|a Lasers
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| 653 |
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|a Materials / Analysis
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| 653 |
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|a Surfaces (Technology)
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| 653 |
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|a Characterization and Analytical Technique
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| 653 |
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|a Surfaces (Physics)
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| 700 |
1 |
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|a Eichhorn, Klaus-Jochen
|e [editor]
|
| 041 |
0 |
7 |
|a eng
|2 ISO 639-2
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| 989 |
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|b Springer
|a Springer eBooks 2005-
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| 490 |
0 |
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|a Springer Series in Surface Sciences
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| 028 |
5 |
0 |
|a 10.1007/978-3-642-40128-2
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| 856 |
4 |
0 |
|u https://doi.org/10.1007/978-3-642-40128-2?nosfx=y
|x Verlag
|3 Volltext
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| 082 |
0 |
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|a 530,417
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| 520 |
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|a Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years
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