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|a 9783642104978
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1 |
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|a Bhushan, Bharat
|e [editor]
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|a Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
|h Elektronische Ressource
|c edited by Bharat Bhushan
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250 |
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|a 1st ed. 2011
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260 |
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|a Berlin, Heidelberg
|b Springer Berlin Heidelberg
|c 2011, 2011
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300 |
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|a XXVI, 710 p. 200 illus
|b online resource
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653 |
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|a Thin films
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653 |
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|a Condensed Matter Physics
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653 |
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|a Surfaces, Interfaces and Thin Film
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653 |
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|a Microtechnology
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653 |
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|a Microsystems and MEMS.
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653 |
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|a Nanotechnology
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653 |
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|a Materials / Analysis
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653 |
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|a Biophysics
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653 |
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|a Surfaces (Technology)
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653 |
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|a Characterization and Analytical Technique
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653 |
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|a Condensed matter
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653 |
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|a Microelectromechanical systems
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041 |
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7 |
|a eng
|2 ISO 639-2
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|b Springer
|a Springer eBooks 2005-
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|a NanoScience and Technology
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5 |
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|a 10.1007/978-3-642-10497-8
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4 |
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|u https://doi.org/10.1007/978-3-642-10497-8?nosfx=y
|x Verlag
|3 Volltext
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|a 620.5
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|a This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective
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