Cover Image
Read Now

Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials

This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to el...

Full description

Bibliographic Details
Main Authors: Breitenstein, Otwin, Warta, Wilhelm (Author), Langenkamp, Martin (Author)
Format: eBook
Language:English
Published: Berlin, Heidelberg Springer Berlin Heidelberg 2010, 2010
Edition:2nd ed. 2010
Series:Springer Series in Advanced Microelectronics
Subjects:
Building Materials
Laser
Engineering
Structural Materials
Lasers
Materials / Analysis
Technology And Engineering
Characterization And Analytical Technique
Online Access:
Collection: Springer eBooks 2005- - Collection details see MPG.ReNa
LEADER 02316nmm a2200373 u 4500
001 EB000382516
003 EBX01000000000000000235568
005 00000000000000.0
007 cr|||||||||||||||||||||
008 130626 ||| eng
020 |a 9783642024177 
100 1 |a Breitenstein, Otwin 
245 0 0 |a Lock-in Thermography  |h Elektronische Ressource  |b Basics and Use for Evaluating Electronic Devices and Materials  |c by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp 
250 |a 2nd ed. 2010 
260 |a Berlin, Heidelberg  |b Springer Berlin Heidelberg  |c 2010, 2010 
300 |a X, 258 p. 89 illus., 33 illus. in color  |b online resource 
505 0 |a Introduction -- Physical and Technical Basics -- Timing Strategies -- Heat Dissipation Mechanisms in Solar Cells -- Carrier Density Imaging -- Illuminated Lock-in Thermography (ILIT) -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook 
653 |a Building materials 
653 |a Laser 
653 |a Engineering 
653 |a Structural Materials 
653 |a Lasers 
653 |a Materials / Analysis 
653 |a Technology and Engineering 
653 |a Characterization and Analytical Technique 
700 1 |a Warta, Wilhelm  |e [author] 
700 1 |a Langenkamp, Martin  |e [author] 
041 0 7 |a eng  |2 ISO 639-2 
989 |b Springer  |a Springer eBooks 2005- 
490 0 |a Springer Series in Advanced Microelectronics 
028 5 0 |a 10.1007/978-3-642-02417-7 
856 4 0 |u https://doi.org/10.1007/978-3-642-02417-7?nosfx=y  |x Verlag  |3 Volltext 
082 0 |a 621.366 
520 |a This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced 

Similar Items