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130626 ||| eng |
020 |
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|a 9783642024177
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100 |
1 |
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|a Breitenstein, Otwin
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245 |
0 |
0 |
|a Lock-in Thermography
|h Elektronische Ressource
|b Basics and Use for Evaluating Electronic Devices and Materials
|c by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp
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250 |
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|a 2nd ed. 2010
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260 |
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|a Berlin, Heidelberg
|b Springer Berlin Heidelberg
|c 2010, 2010
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300 |
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|a X, 258 p. 89 illus., 33 illus. in color
|b online resource
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505 |
0 |
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|a Introduction -- Physical and Technical Basics -- Timing Strategies -- Heat Dissipation Mechanisms in Solar Cells -- Carrier Density Imaging -- Illuminated Lock-in Thermography (ILIT) -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook
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653 |
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|a Building materials
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653 |
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|a Laser
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653 |
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|a Engineering
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653 |
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|a Structural Materials
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653 |
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|a Lasers
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653 |
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|a Materials / Analysis
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653 |
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|a Technology and Engineering
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653 |
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|a Characterization and Analytical Technique
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700 |
1 |
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|a Warta, Wilhelm
|e [author]
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700 |
1 |
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|a Langenkamp, Martin
|e [author]
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041 |
0 |
7 |
|a eng
|2 ISO 639-2
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989 |
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|b Springer
|a Springer eBooks 2005-
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490 |
0 |
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|a Springer Series in Advanced Microelectronics
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028 |
5 |
0 |
|a 10.1007/978-3-642-02417-7
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856 |
4 |
0 |
|u https://doi.org/10.1007/978-3-642-02417-7?nosfx=y
|x Verlag
|3 Volltext
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082 |
0 |
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|a 621.366
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520 |
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|a This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced
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