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01969nmm a2200397 u 4500 |
| 001 |
EB000380751 |
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EBX01000000000000000233803 |
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00000000000000.0 |
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| 008 |
130626 ||| eng |
| 020 |
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|a 9783540850373
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| 100 |
1 |
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|a Bhushan, Bharat
|e [editor]
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| 245 |
0 |
0 |
|a Applied Scanning Probe Methods XI
|h Elektronische Ressource
|b Scanning Probe Microscopy Techniques
|c edited by Bharat Bhushan, Harald Fuchs
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| 250 |
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|a 1st ed. 2009
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| 260 |
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|a Berlin, Heidelberg
|b Springer Berlin Heidelberg
|c 2009, 2009
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| 300 |
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|a LVI, 236 p. 113 illus., 22 illus. in color
|b online resource
|
| 505 |
0 |
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|a Oscillation Control in Dynamic SPM with Quartz Sensors -- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation -- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies -- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science -- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements -- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip -- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations -- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction
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| 653 |
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|a Surface and Interface and Thin Film
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| 653 |
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|a Spectrum analysis
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| 653 |
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|a Thin films
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| 653 |
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|a Spectroscopy
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| 653 |
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|a Polymers
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| 653 |
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|a Surfaces, Interfaces and Thin Film
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| 653 |
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|a Microtechnology
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| 653 |
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|a Microsystems and MEMS.
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| 653 |
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|a Nanotechnology
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| 653 |
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|a Surfaces (Technology)
|
| 653 |
|
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|a Microelectromechanical systems
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| 653 |
|
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|a Surfaces (Physics)
|
| 700 |
1 |
|
|a Fuchs, Harald
|e [editor]
|
| 041 |
0 |
7 |
|a eng
|2 ISO 639-2
|
| 989 |
|
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|b Springer
|a Springer eBooks 2005-
|
| 490 |
0 |
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|a NanoScience and Technology
|
| 028 |
5 |
0 |
|a 10.1007/978-3-540-85037-3
|
| 856 |
4 |
0 |
|u https://doi.org/10.1007/978-3-540-85037-3?nosfx=y
|x Verlag
|3 Volltext
|
| 082 |
0 |
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|a 621,381
|