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Transmission Electron Microscopy and Diffractometry of Materials

It is a superb book.’’ Colin Humphreys, Cambridge University ``This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and elec...

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Bibliographic Details
Main Authors: Fultz, Brent, Howe, James (Author)
Format: eBook
Language:English
Published: Berlin, Heidelberg Springer Berlin Heidelberg 2008, 2008
Edition:3rd ed. 2008
Subjects:
Spectrum Analysis
Engineering
Thin Films
Condensed Matter Physics
Spectroscopy
Surfaces, Interfaces And Thin Film
Crystallography
Materials / Analysis
Technology And Engineering
Surfaces (technology)
Characterization And Analytical Technique
Condensed Matter
Crystallography And Scattering Methods
Online Access:
Collection: Springer eBooks 2005- - Collection details see MPG.ReNa
Table of Contents:
  • Diffraction and the X-Ray Powder Diffractometer
  • The TEM and its Optics
  • Scattering
  • Inelastic Electron Scattering and Spectroscopy
  • Diffraction from Crystals
  • Electron Diffraction and Crystallography
  • Diffraction Contrast in TEM Images
  • Diffraction Lineshapes
  • Patterson Functions and Diffuse Scattering
  • High-Resolution TEM Imaging
  • High-Resolution STEM Imaging
  • Dynamical Theory

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