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130626 ||| eng |
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|a 9783540302797
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| 100 |
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|a Verma, Hem Raj
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| 245 |
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|a Atomic and Nuclear Analytical Methods
|h Elektronische Ressource
|b XRF, Mössbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques
|c by Hem Raj Verma
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| 250 |
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|a 1st ed. 2007
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| 260 |
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|a Berlin, Heidelberg
|b Springer Berlin Heidelberg
|c 2007, 2007
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| 300 |
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|a XIV, 376 p. 128 illus
|b online resource
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| 505 |
0 |
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|a X-ray Fluorescence (XRF) and Particle-Induced X-ray Emission (PIXE) -- Rutherford Backscattering Spectroscopy -- Elastic Recoil Detection -- Mössbauer Spectroscopy (MS) -- X-Ray Photoelectron Spectroscopy -- Neutron Activation Analysis -- Nuclear Reaction Analysis and Particle-Induced Gamma-Ray Emission -- Accelerator Mass Spectrometry (AMS)
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| 653 |
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|a Physical measurements
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| 653 |
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|a Atoms
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| 653 |
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|a Characterization and Evaluation of Materials
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| 653 |
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|a Analytical Chemistry
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| 653 |
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|a Condensed Matter Physics
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| 653 |
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|a Atomic, Molecular, Optical and Plasma Physics
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| 653 |
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|a Analytical chemistry
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| 653 |
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|a Materials science
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| 653 |
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|a Measurement Science and Instrumentation
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| 653 |
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|a Physics
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| 653 |
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|a Condensed matter
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| 653 |
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|a Measurement
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| 041 |
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7 |
|a eng
|2 ISO 639-2
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| 989 |
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|b Springer
|a Springer eBooks 2005-
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| 856 |
4 |
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|u https://doi.org/10.1007/978-3-540-30279-7?nosfx=y
|x Verlag
|3 Volltext
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| 082 |
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|a 530.8
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| 520 |
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|a This book is a blend of analytical methods based on the phenomenon of atomic and nuclear physics. It comprises comprehensive presentations about X-ray Fluorescence (XRF), Mössbauer Spectroscopy (MS), X-ray Photoelectron Spectroscopy (XPS), Neutron- Activation Analysis (NAA), Particle Induced X-ray Emission Analysis (PIXE), Rutherford Backscattering Analysis (RBS), Elastic Recoil Detection (ERD), Nuclear Reaction Analysis (NRA), Particle Induced Gamma-ray Emission Analysis (PIGE), and Accelerator Mass Spectrometry (AMS). These techniques are commonly applied in the fields of medicine, biology, environmental studies, archaeology or geology et al. and pursued in major international research laboratories
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