System-level Test and Validation of Hardware/Software Systems
New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. As well as giving rise to new design practices,...
Other Authors: | , , |
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Format: | eBook |
Language: | English |
Published: |
London
Springer London
2005, 2005
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Edition: | 1st ed. 2005 |
Series: | Springer Series in Advanced Microelectronics
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Subjects: | |
Online Access: | |
Collection: | Springer eBooks 2005- - Collection details see MPG.ReNa |
Table of Contents:
- Modeling Permanent Faults
- Test Generation: A Symbolic Approach
- Test Generation: A Heuristic Approach
- Test Generation: A Hierarchical Approach
- Test Program Generation from High-level Microprocessor Descriptions
- Tackling Concurrency and Timing Problems
- An Approach to System-level Design for Test
- System-level Dependability Analysis