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Modeling Nanoscale Imaging in Electron Microscopy

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission...

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Bibliographic Details
Other Authors: Vogt, Thomas (Editor), Dahmen, Wolfgang (Editor), Binev, Peter (Editor)
Format: eBook
Language:English
Published: New York, NY Springer New York 2012, 2012
Edition:1st ed. 2012
Series:Nanostructure Science and Technology
Subjects:
Measurement
Chemistry, Physical And Theoretical
Theoretical Chemistry
Analytical Chemistry
Nanotechnology
Materials / Analysis
Measuring Instruments
Characterization And Analytical Technique
Measurement Science And Instrumentation
Online Access:
Collection: Springer eBooks 2005- - Collection details see MPG.ReNa
Description
Summary:Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing
Physical Description:IX, 182 p online resource
ISBN:9781461421917

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