Process Variations and Probabilistic Integrated Circuit Design
Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality,...
| Other Authors: | , |
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| Format: | eBook |
| Language: | English |
| Published: |
New York, NY
Springer New York
2012, 2012
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| Edition: | 1st ed. 2012 |
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| Online Access: | |
| Collection: | Springer eBooks 2005- - Collection details see MPG.ReNa |
Table of Contents:
- Introduction
- Physical and Mathematical Fundamentals
- Examination of Process Parameter Variations
- Methods of Parameter Variations
- Consequences for Circuits Design and Case Studies
- Conclusion