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130626 ||| eng |
| 020 |
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|a 9780387286686
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| 100 |
1 |
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|a Kalinin, Sergei V.
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| 245 |
0 |
0 |
|a Scanning Probe Microscopy
|h Elektronische Ressource
|b Electrical and Electromechanical Phenomena at the Nanoscale
|c by Sergei V. Kalinin, Alexei Gruverman
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| 250 |
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|a 1st ed. 2007
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| 260 |
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|a New York, NY
|b Springer New York
|c 2007, 2007
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| 300 |
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|a XL, 980 p. 365 illus., 15 illus. in color
|b online resource
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| 505 |
0 |
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|a High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices -- Electrical Nanofabrication -- Electrical SPM-Based Nanofabrication Techniques -- Fundamental Science and Lithographic Applications of Scanning Probe Oxidation -- UHV-STM Nanofabrication on Silicon -- Ferroelectric Lithography -- Patterned Self-Assembled Monolayers via Scanning Probe Lithography -- Resistive Probe Storage: Read/Write Mechanism
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| 505 |
0 |
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|a Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices -- Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks -- Theory of Scanning Probe Microscopy -- Multi-Probe Scanning Tunneling Microscopy -- Dynamic Force Microscopy and Spectroscopy in Vacuum -- Scanning Tunneling Microscopy and Spectroscopy of Manganites -- Electrical SPM Characterization of Materials and Devices -- Scanning Voltage Microscopy -- Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces -- Electromechanical Behavior in Biological Systems at the Nanoscale -- Scanning Capacitance Microscopy -- Kelvin Probe Force Microscopy of Semiconductors -- Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy -- Electron Flow Through MolecularStructures -- Electrical Characterization of Perovskite Nanostructures by SPM -- SPM Measurements of Electric Properties of Organic Molecules --
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| 505 |
0 |
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|a SPM Techniques for Electrical Characterization -- Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport -- Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy -- Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics -- Principles of Kelvin Probe Force Microscopy -- Frequency-Dependent Transport Imaging by Scanning Probe Microscopy -- Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy -- Principles of Near-Field Microwave Microscopy -- Electromagnetic Singularities and Resonances in Near-Field Optical Probes -- Electrochemical SPM -- Near-Field High-Frequency Probing -- Electrical and Electromechanical Imaging at the Limits of Resolution -- Scanning Probe Microscopy on Low-Dimensional Electron Systems in III–V Semiconductors -- Spin-Polarized Scanning Tunneling Microscopy -- Scanning Probe Measurements of Electron Transport in Molecules --
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| 653 |
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|a Mechanical Engineering
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| 653 |
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|a Biophysics
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| 653 |
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|a Nanotechnology
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| 653 |
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|a Surfaces (Technology)
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| 653 |
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|a Surfaces, Interfaces and Thin Film
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| 653 |
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|a Mechanical engineering
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| 653 |
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|a Condensed Matter Physics
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| 653 |
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|a Condensed matter
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| 653 |
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|a Materials / Analysis
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| 653 |
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|a Thin films
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| 653 |
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|a Bioanalysis and Bioimaging
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| 653 |
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|a Characterization and Analytical Technique
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| 700 |
1 |
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|a Gruverman, Alexei
|e [author]
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| 041 |
0 |
7 |
|a eng
|2 ISO 639-2
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| 989 |
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|b Springer
|a Springer eBooks 2005-
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| 028 |
5 |
0 |
|a 10.1007/978-0-387-28668-6
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| 856 |
4 |
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|u https://doi.org/10.1007/978-0-387-28668-6?nosfx=y
|x Verlag
|3 Volltext
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| 082 |
0 |
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|a 620.112
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| 520 |
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|a Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography
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