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00753nmm a2200193 u 4500 |
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EB000352184 |
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EBX01000000000000000205236 |
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00000000000000.0 |
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cr||||||||||||||||||||| |
008 |
130610 ||| |
020 |
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|a 073811779X
|
020 |
|
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|a 0738117803
|
245 |
0 |
0 |
|a 2000.2-1999 - IEEE Recommended Practice for Information Technology - Year 2000 Test Methods
|h Elektronische Ressource
|
260 |
|
|
|a New York
|b The Institute of Electrical and Electronics Engineers, Inc.
|c 1999
|
653 |
|
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|a Components, Circuits, Devices and Systems; General Topics for Engineers
|
989 |
|
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|b IEEESTAND
|a IEEE Standards
|
088 |
|
|
|a 2000.2-1999
|
856 |
4 |
0 |
|u https://ieeexplore.ieee.org/servlet/opac?punumber=6643
|x Verlag
|3 Volltext
|
082 |
0 |
|
|a 600
|