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1232-1995 - IEEE Standard for Artificial Intelligence and Expert System Tie to Automatic Test Equipment (AI-ESTATE): Overview and Architecture

Bibliographic Details
Format: eBook
Published: New York The Institute of Electrical and Electronics Engineers, Inc. 1996
Subjects:
Power, Energy And Industry Applications; Components, Circuits, Devices And Systems
Online Access:
https://ieeexplore.ieee.org/servlet/opac?punumber=...
Collection: IEEE Standards - Collection details see MPG.ReNa
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Description
ISBN:9780738135311

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