MPG.eBooks - Description: 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits

Read Now

Bibliographic Details
Format:	eBook
Published:	New York The Institute of Electrical and Electronics Engineers, Inc. 2008
Subjects:	Components, Circuits, Devices And Systems; Engineered Materials, Dielectrics And Plasmas; Fields, Waves And Electromagnetics; General Topics For Engineers
Online Access:	https://ieeexplore.ieee.org/servlet/opac?punumber=...
Collection:	IEEE Conference Proceedings - Collection details see MPG.ReNa

Description
ISBN:	9781509077205 9781424420391