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00696nmm a2200169 u 4500 |
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EB000306315 |
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EBX01000000000000000105168 |
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00000000000000.0 |
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110826 ||| |
020 |
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|a 081866245X
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245 |
0 |
0 |
|a Proceedings of IEEE International Workshop on Memory Technology, Design, and Test
|h Elektronische Ressource
|
260 |
|
|
|a New York
|b The Institute of Electrical and Electronics Engineers, Inc.
|c 1994
|
653 |
|
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|a Computing and Processing; Components, Circuits, Devices and Systems
|
989 |
|
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|b IEEEPROC
|a IEEE Conference Proceedings
|
856 |
4 |
0 |
|u https://ieeexplore.ieee.org/servlet/opac?punumber=3170
|x Verlag
|3 Volltext
|
082 |
0 |
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|a 600
|