Cover Image
Read Now

Nanocharacterisation

Chemical characterisation techniques have been essential tools in nanotechnology in recent years and Nanocharacterisation is a rapidly developing field, Chemical characterisation techniques have been essential tools in underpinning the explosion in nanotechnology in recent years and nanocharacterisa...

Full description

Bibliographic Details
Main Author: Hutchison, John
Other Authors: Kirkland, Angus, O'Brien, Paul, Pennycook, S J
Format: eBook
Language:English
Published: Cambridge Royal Society of Chemistry 2007
Online Access:
Collection: RSC eBook Collection 1968-2009 - Collection details see MPG.ReNa
Table of Contents:
  • 5.1.1 Basis of Off-axis Electron Holography
  • 5.1.2 Experimental Considerations
  • 5.2 The Mean Inner Potential Contribution to the Phase Shift
  • 5.3 Measurement of Magnetic Fields
  • 5.3.1 Early Experiments
  • 5.3.2 Experiments Involving Digital Acquisition and Analysis
  • 5.4 Measurement of Electrostatic Fields
  • 5.4.1 Electrically Biased Nanowires
  • 5.4.2 Dopant Potentials in Semiconductors
  • 5.4.3 Space-charge Layers at Grain Boundaries
  • 5.5 High resolution Electron Holography
  • 5.6 Alternative Forms of Electron Holography
  • 5.7 Discussion, Prospects for the Future and Conclusions
  • Acknowledgements
  • References
  • Chapter 6: Electron Tomography
  • 6.1 Introduction
  • 6.2 Theory of Electron Tomography
  • 6.2.1 From Projection to Reconstruction
  • 6.2.2 Backprojection: Real-space Reconstruction
  • 6.2.3 Constrained Reconstructions
  • 6.2.4 Reconstruction Resolution
  • 6.2.5 Measuring Reconstruction Resolution
  • 6.2.6 The Projection Requirement
  • 6.3 Acquiring Tilt Series
  • 6.3.1 Instrumental Considerations
  • 6.3.2 Specimen Support and Positioning
  • 6.3.3 Specimen Considerations
  • 6.4 Alignment of Tilt Series
  • 6.4.1 Alignment by Tracking of Fiducial Markers
  • 6.4.2 Alignment by Crosscorrelation
  • 6.4.3 Rotational Alignment without Fiducial Markers
  • 6.4.4 Other Markerless Alignment Techniques
  • 6.5 Visualisation, Segmentation and Data Mining
  • 6.5.1 Visualisation Techniques
  • 6.5.2 Volume Rendering
  • 6.5.3 Segmentation
  • 6.5.4 Quantitative Analysis
  • 6.6 Imaging Modes
  • 6.6.1 Bright-field TEM
  • 6.6.2 Dark-field (DF) Tomography
  • 6.6.3 HAADF STEM
  • 6.6.4 Meeting the Projection Requirement
  • 6.6.5 Experimental Considerations
  • 6.6.6 Limitations
  • 6.6.7 Core-loss (Chemical Mapping) EFTEM
  • 6.6.8 Low-loss EFTEM
  • 6.6.9 Energy Dispersive X-ray (EDX) Mapping
  • 6.6.10 Holographic Tomography
  • 6.7 New Techniques
  • 6.7.1 Electron Energy-loss Spectroscopy (EELS) Spectrum Imaging
  • 6.7.2 Confocal STEM
  • 6.7.3 Atomistic Tomography
  • 6.8 Conclusions
  • References
  • 3.7 Tunneling Spectroscopy
  • 3.8 Tip Artefacts in STM Imaging
  • 3.9 Conclusions
  • References
  • Chapter 4: Electron Energy-loss Spectroscopy and Energy Dispersive X-ray Analysis
  • 4.1 What is Nanoanalysis?
  • 4.2 Nanoanalysis in the Electron Microscope
  • 4.2.1 General Instrumentation
  • 4.3 X-ray Analysis in the TEM
  • 4.3.1 Basics of X-ray Analysis
  • 4.3.2 Analysis and Quantification of X-ray Emission Spectra
  • 4.3.3 Application to the Analysis of Nanometre Volumes in the S/TEM
  • 4.3.4 Related Photon Emission Techniques in the TEM
  • 4.4 Basics of EELS
  • 4.4.1 Instrumentation for EELS
  • 4.4.2 Basics of the EEL Spectrum
  • 4.4.3 Quantification of EELS - The Determination of Chemical Composition
  • 4.4.4 Determination of Electronic Structure and Bonding
  • 4.4.5 Application to the Analysis of Nanometre Volumes in the S/TEM
  • 4.5 EELS Imaging
  • 4.6 Radiation Damage
  • 4.7 Emerging Techniques
  • 4.8 Conclusions
  • References
  • Chapter 5: Electron Holography of Nanostructured Materials
  • Chapter 1: Characterization of Nanomaterials using Transmission Electron Microscopy
  • 1.1 Introduction
  • 1.2 Imaging
  • 1.2.1 Transmission Electron Microscopy
  • 1.2.2 High-resolution electron Microscopy
  • 1.2.3 Basis of High-resolution Imaging
  • 1.2.4 Resolution Limits
  • 1.2.5 Lattice Imaging or Atomic Imaging
  • 1.2.6 Instrumental Parameters
  • 1.3 Survey of Applications
  • 1.3.1 Developments in HREM
  • 1.3.2 Small Particles and Precipitates
  • 1.3.3 Two-dimensional Objects
  • 1.3.4 One-dimensional Objects
  • 1.3.5 Zero-dimensional Objects
  • 1.3.6 Surfaces and Interfaces
  • 1.4 Emerging Trends and Practical Concerns
  • 1.4.1 Atomic Location and Quantitative Imaging
  • 1.4.2 Detection and Correction of Aberrations
  • 1.4.3 Stobbs' Factor
  • 1.4.4 Radiation Damage
  • 1.5 Conclusions
  • Acknowledgements
  • References
  • Chapter 2: Scanning Transmission Electron Microscopy
  • 2.1 Introduction
  • 2.1.1 Basic Description
  • 2.1.2 Detectors
  • 2.1.3 Electron Energy-loss Spectroscopy
  • 2.2 Aberration-corrected STEM
  • 2.2.1 The Aberration Function
  • 2.2.2 Spherical and Chromatic Aberration
  • 2.2.3 Aberration Correctors
  • 2.2.4 What Do We See in a STEM?
  • 2.2.5 Measuring Aberrations
  • 2.2.6 Phonons
  • 2.2.7 Resolution
  • 2.2.8 Three-dimensional Microscopy
  • 2.2.9 Channeling
  • 2.3 Applications to Nanostructure Characterisation in Catalysis
  • 2.3.1 Anomalous Pt-Pt Distances in the Pt/alumina Catalytic Systems
  • 2.3.2 La Stabilisation of Catalytic Supports
  • 2.3.3 CO Oxidation by Supported Noble-metal Nanoparticles
  • 2.4 Summary and Outlook
  • Acknowledgements
  • References
  • Chapter 3: Scanning Tunneling Microscopy of Surfaces and Nanostructures
  • 3.1 History of the STM
  • 3.2 The Tunneling Interaction and Basic Operating Principles of STM
  • 3.3 Atomic-resolution Imaging of Surface Reconstructions
  • 3.4 Imaging of Surface Nanostructures
  • 3.5 Manipulation of Adsorbed Atoms and Molecules
  • 3.6 Influence of the Surface Electronic States on STM Images
  • Chapter 7: In-situ Environmental (Scanning) Transmission Electron Microscopy
  • 7.1 Introduction
  • 7.2 Background
  • 7.3 Recent Advances in Atomic-resolution In-situ ETEM
  • 7.4 Impact of the Atomic-resolution In-situ ETEM and Global Applications
  • 7.5 Applications of Atomic-resolution In-situ ETEM in the Studies of Gas-Catalyst and Liquid-Catalyst Reactions
  • 7.5.1 Liquid-phase Hydrogenation and Polymerisation Reactions
  • 7.5.2 Development of Nanocatalysts for Novel Hydrogenation Chemistry and Dynamic Imaging of Desorbed Organic Products in Liquid-phase Reactions
  • 7.5.3 Butane Oxidation Technology
  • 7.5.4 In-situ Observations of Carbon Nanotubes (CNTs) in Chemical and Thermal Environments
  • 7.6 Conclusions
  • Acknowledgements
  • References
  • Subject Index

Similar Items