1 Table of Contents: ... Modeling -- Thermal Simulation for VLSI Systems -- Fast-timing Electrothermal Simulation...

2
by Leblebici, Yusuf, Sung-Mo (Steve) Kang
Published 1993
Springer US
Table of Contents: ...1. Introduction -- 1.1. The Concept of IC Reliability -- 1.2. Design-for-Reliability -- 1.3. VLSI...

3
by Sapatnekar, S., Sung-Mo (Steve) Kang
Published 1993
Springer US
... with the increasing complexity in very large scale integrated (VLSI) circuits, the productivity of chip designers...

4
by Diaz, Carlos H., Sung-Mo (Steve) Kang, Duvvury, Charvaka
Published 1995
Springer US
... of thermal failure. Modeling of Electrical Overstress in Integrated Circuits is for VLSI designers...