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1
Analysis and Design of Resilient
VLSI
Circuits : Mitigating Soft Errors and Process Variations
by
Garg, Rajesh
Published 2010
Springer US
“
...
VLSI
processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult...
”
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2
Minimizing and Exploiting Leakage in
VLSI
Design
by
Jayakumar, Nikhil
,
Paul, Suganth
,
Garg, Rajesh
Published 2010
Springer US
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621 - Applied physics
2
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English
2
Collection
Springer eBooks 2005-
2
Author
Garg, Rajesh
Jayakumar, Nikhil
1
Paul, Suganth
1
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