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dewey-ones:"543 - Analytical chemistry"
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1
Secondary Ion Mass Spectrometry SIMS II : Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California,...
Published 1979
Springer Berlin Heidelberg
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2
Meson and Baryon Spectroscopy
by
Lichtenberg, D.B.
Published 1964
Springer New York
“
... at the
Stanford
Linear Accelerator Center in the fall of 1962. The notes of these lectures were issued as a...
”
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3
EXAFS Spectroscopy : Techniques and Applications
by
Teo, B. K.
,
Joy, D. C.
Published 1981
Springer US
Table of Contents:
“
... in Solids -- 14 Materials Research at
Stanford
Synchrotron Radiation Laboratory -- 15 Cornell High Energy...
”
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4
Secondary Ion Mass Spectrometry SIMS IV : Proceedings of the Fourth International Conference, Osaka, Japan, November 13–19, 1983
Published 1984
Springer Berlin Heidelberg
“
..., it followed earlier conferences held in MUnster (1977),
Stanford
(1979), and Budapest (1981). The conference...
”
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5
Secondary Ion Mass Spectrometry SIMS III : Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30–September 5, 1981
Published 1982
Springer Berlin Heidelberg
“
...Following the biannual meetings in MUnster (1977) and
Stanford
(1979) the Third International...
”
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Classification: 543 - Analytical chemistry
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543 - Analytical chemistry
Language
English
5
Collection
Springer Book Archives -2004
5
Author
Benninghoven, A.
3
Shimizu, R.
2
Evans, C.A. Jr
1
Giber, J.
1
Joy, D. C.
1
Laszlo, J.
1
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Lichtenberg, D.B.
1
Okano, J.
1
Powell, R.A.
1
Riedel, M.
1
Teo, B. K.
1
Werner, H.W.
1
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