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1
by Orloff, Jon, Swanson, Lynwood, Utlaut, Mark
Published 2003
Springer US
Table of Contents: “... Copper -- 6.10. Access to Die Circuitry from the “Backside” -- 6.11. Secondary Ion Mass Spectrometry (Fib...”
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2
Published 1999
Springer US
Table of Contents: “...9.4 Cross Section Decoration: Staining -- 9.5 Focused Ion Beam (FIB) Techniques -- 9.6 Sectioning...”
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3
Published 1983
Springer Netherlands
Table of Contents: “...-Dimensional Image Deconvolutions -- QSO Luminosities at ? 1 MM -- QSO Redshift Limit and Periodicity in a FIB...”