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61
Optical Measurement Systems for Industrial
Inspection
VIII
Published 2013
SPIE
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62
Optical Metrology and
Inspection
for Industrial Applications II
Published 2013
SPIE
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63
Metrology,
Inspection
, and Process Control for Microlithography XXII
Published 2008
SPIE
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64
Metrology,
Inspection
, and Process Control for Microlithography XXI
Published 2007
SPIE
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65
Metrology,
Inspection
, and Process Control for Microlithography XVIII
Published 2004
SPIE
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66
Machine Vision Applications in Industrial
Inspection
XI
Published 2003
SPIE
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67
Machine Vision Systems for
Inspection
and Metrology VIII
Published 1999
SPIE
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68
Metrology,
Inspection
, and Process Control for Microlithography XVI
Published 2002
SPIE
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69
Machine Vision Systems for
Inspection
and Metrology VII
Published 1998
SPIE
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70
Machine Vision Applications in Industrial
Inspection
V
Published 1997
SPIE
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71
Machine Vision Applications in Industrial
Inspection
VI
Published 1998
SPIE
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72
Machine Vision Applications in Industrial
Inspection
II
Published 1994
SPIE
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73
Metrology,
Inspection
, and Process Control for Microlithography X
Published 1996
SPIE
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74
Metrology,
Inspection
, and Process Control for Microlithography XX
Published 2006
SPIE
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75
Machine Vision Applications in Industrial
Inspection
XIV
Published 2006
SPIE
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76
Optical Measurement Systems for Industrial
Inspection
IV
Published 2005
SPIE
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77
Metrology,
Inspection
, and Process Control for Microlithography XIX
Published 2005
SPIE
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78
Machine Vision Applications in Industrial
Inspection
XII
Published 2004
SPIE
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79
Metrology,
Inspection
, and Process Control for Microlithography XI
Published 1997
SPIE
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80
Machine Vision Applications in Industrial
Inspection
III
Published 1995
SPIE
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