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1
Optoelectronic
Metrology
Published 1999
SPIE
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2
Interferometric
Metrology
Published 1987
SPIE
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3
Nano- and Micro-
Metrology
Published 2005
SPIE
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4
Speckle
Metrology
2003
Published 2003
SPIE
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5
Microsystems
Metrology
and Inspection
Published 1999
SPIE
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6
Laser
Metrology
and Inspection
Published 1999
SPIE
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7
Microlithography and
Metrology
in Micromachining
Published 1995
SPIE
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8
Time and Frequency
Metrology
Published 2007
SPIE
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9
Industrial Vision
Metrology
Published 1991
SPIE
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10
Quantum Electronics
Metrology
Published 2008
SPIE
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11
Photomechanics and Speckle
Metrology
Published 1987
SPIE
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12
Precision Surface
Metrology
Published 1983
SPIE
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13
Metrology
of Optoelectronic Systems
Published 1987
SPIE
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14
Metrology
: Figure and Finish
Published 1987
SPIE
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15
Optical Testing and
Metrology
Published 1986
SPIE
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16
Instrumentation,
Metrology
, and Standards for Nanomanufacturing
Published 2007
SPIE
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17
Optical
Metrology
in Production Engineering
Published 2004
SPIE
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18
Optical Fabrication, Testing, and
Metrology
Published 2004
SPIE
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19
Optical
Metrology
for Arts and Multimedia
Published 2003
SPIE
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20
Nanostructure Science,
Metrology
, and Technology
Published 2002
SPIE
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