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product_txtF_mv:"SPIE Conference Proceedings"
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1
Handbook of
Critical
Dimension Metrology and Process Control: A
Critical
Review
Published 1994
SPIE
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2
MEMS Reliability for
Critical
Applications
Published 2000
SPIE
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3
Critical
Technologies for the Future of Computing
Published 2000
SPIE
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4
Optomechanical Design: A
Critical
Review
Published 1992
SPIE
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5
Optical Metrology: A
Critical
Review
Published 1999
SPIE
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6
Remote Sensing:
Critical
Review of Technology
Published 1984
SPIE
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7
Lens Design: A
Critical
Review
Published 1992
SPIE
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8
Critical
Review: Industrial Lasers and Applications
Published 2005
SPIE
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9
MEMS Reliability for
Critical
and Space Applications
Published 1999
SPIE
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10
Digital Optical Computing: A
Critical
Review
Published 1990
SPIE
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11
Wavelength Division Multiplexing: A
Critical
Review
Published 1999
SPIE
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12
Fiber Optic Sensors: A
Critical
Review
Published 1993
SPIE
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13
Inorganic Optical Materials: A
Critical
Review
Published 1996
SPIE
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14
Optoelectronic Interconnects and Packaging: A
Critical
Review
Published 1996
SPIE
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15
Optical Inspection and Testing: A
Critical
Review
Published 1993
SPIE
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16
Diffractive and Miniaturized Optics: A
Critical
Review
Published 1993
SPIE
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17
Integrated Optics and Optoelectronics: A
Critical
Review
Published 1993
SPIE
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18
Advancement of Photonics for Space: A
Critical
Review
Published 1997
SPIE
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19
Infrared Thin Films: A
Critical
Review
Published 1992
SPIE
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20
Optical Pattern Recognition: A
Critical
Review
Published 1992
SPIE
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Collection: SPIE Conference Proceedings
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52
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SPIE Conference Proceedings
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