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product_txtF_mv:"SPIE Conference Proceedings"
dewey-ones:"500 - Natural sciences & mathematics"
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1
Industrial
Inspection
Published 1989
SPIE
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2
Robotics and Industrial
Inspection
Published 1983
SPIE
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3
Automated
Inspection
and Measurement
Published 1987
SPIE
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4
Automatic
Inspection
and Measurement
Published 1985
SPIE
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5
Automatic Optical
Inspection
Published 1986
SPIE
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6
Microsystems Metrology and
Inspection
Published 1999
SPIE
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7
Laser Metrology and
Inspection
Published 1999
SPIE
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8
Cargo
Inspection
Technologies
Published 1994
SPIE
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9
Optical
Inspection
and Micromeasurements
Published 1996
SPIE
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10
Industrial
Inspection
II
Published 1990
SPIE
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11
Imaging Techniques for Testing and
Inspection
Published 1972
SPIE
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12
Optical Techniques for Industrial
Inspection
Published 1986
SPIE
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13
Microsystems Engineering: Metrology and
Inspection
Published 2001
SPIE
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14
Optical
Inspection
and Micromeasurements II
Published 1997
SPIE
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15
Non-Intrusive
Inspection
Technologies
Published 2006
SPIE
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16
Automatic
Inspection
and Novel Instrumentation
Published 1997
SPIE
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17
Automated Optical
Inspection
for Industry
Published 1996
SPIE
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18
Process Control and
Inspection
for Industry
Published 2000
SPIE
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19
Imaging and Illumination for Metrology and
Inspection
Published 1994
SPIE
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20
Nondestructive
Inspection
of Aging Aircraft
Published 1993
SPIE
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SPIE Conference Proceedings
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