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21
Infrared Detectors and Emitters:
Materials
and Devices
Published 2001
Springer US
Table of Contents:
“
... -- 2.1 Introduction --
2.2
Material
Characterization -- 2.3 Device Characterization -- 2.4 Detector...
”
Read Now
22
Compound Semiconductors Strained Layers and Devices
Published 2000
Springer US
Table of Contents:
“
... -- 1.3 III-Nitrides -- 1.4 Wide bandgap II-VI semiconductors -- 1.5
Material
parameters -- 1.6 Scope...
”
Read Now
23
Electrets In Engineering : Fundamentals and Applications
by
Kestelman, Vladimir N.
,
Pinchuk, Leonid S.
,
Goldade, Victor A.
Published 2000
Springer US
Table of Contents:
“
... production and properties -- 1.3. Electric fields as referred to
materials
technology -- References -- 2...
”
Read Now
24
Diamond: Electronic Properties and Applications
Published 1995
Springer US
Table of Contents:
“
... Introduction --
2.2
The Clean Surfaces: C(100), C(l 10), C(l 11) -- 2.3 Impurity Stabilized Surfaces -- 2.4...
”
Read Now
25
Optical
Constants of Crystalline and Amorphous Semiconductors : Numerical Data and Graphical Information
by
Adachi, Sadao
Published 1999
Springer US
Table of Contents:
“
... Mercury Zinc Telluride (Hg1-xZnxTe) -- D21 Mercury CadmiumSelenide (Hg1-xCdxSe) -- D
22
Mercury Cadmium...
”
Read Now
26
Magnetostatic Waves and Their Application
by
Kabos, Pavel
,
Stalmachov, V.S.
Published 1994
Springer Netherlands
Table of Contents:
“
... magnetic field -- 5.2 Parametric excitation (amplification) of magnetostatic waves in magnetic
materials
...
”
Read Now
27
Wave Scattering in Complex Media: From Theory to Applications : Proceedings of the NATO Advanced Study Institute on Wave Scattering in Complex Media: From Theory to Applications Ca...
Published 2003
Springer Netherlands
Table of Contents:
“
... Layer with Partially Ordered Soft Particles --
Optical
Microrheology of Soft Complex
Materials
...
”
Read Now
28
Low Dielectric Constant
Materials
for IC Applications
Published 2003
Springer Berlin Heidelberg
Table of Contents:
“
... --
2.2
Thin-Film
Material
Characterization -- 2.3 General Structure-Property Relationships -- 2.4...
”
Read Now
29
Semiconductors : Other than Group IV Elements and III–V Compounds
Published 1992
Springer Berlin Heidelberg
Table of Contents:
“
... Group III elements --
2.2
Group IV elements -- 2.3 Group V elements -- 2.4 Group VI elements -- 3 Binary...
”
Read Now
30
The Physics and Chemistry of Carbides, Nitrides and Borides
Published 1990
Springer Netherlands
Table of Contents:
“
...
Materials
and Thin Films — Electrical,
Optical
and Thermal Properties --
Optical
and Electronic Properties...
”
Read Now
31
The Drift Diffusion Equation and Its Applications in MOSFET Modeling
by
Hänsch, Wilfried
Published 1991
Springer Vienna
Table of Contents:
“
...-Equilibrium Green’s Functions -- References -- 2 Hydrodynamic Model -- 2.1 Introduction --
2.2
Linear Response...
”
Read Now
32
Parametric Electronics : An Introduction
by
Löcherer, K.-H.
,
Brandt, C.-D.
Published 1982
Springer Berlin Heidelberg
Table of Contents:
“
... -- 2.1 Capacitances --
2.2
Inductances -- 2.3 Problems -- 3. Distributed Nonlinear Reactances -- 3.1...
”
Read Now
33
Physics of Quantum Electron Devices
Published 1990
Springer Berlin Heidelberg
Table of Contents:
“
... Microstructures -- 2.1 Dimensional Confinement and Device Concepts --
2.2
Molecular Beam Epitaxy -- 2.3...
”
Read Now
34
Point Defects in Semiconductors and Insulators : Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions
by
Spaeth, Johann-Martin
,
Overhof, Harald
Published 2003
Springer Berlin Heidelberg
Table of Contents:
“
....
Optical
Detection of Electron Paramagnetic Resonance -- 4.1
Optical
Transitions of Defects in Solids...
”
Read Now
35
Optical
Sensors and Microsystems : New Concepts, Materials, Technologies
Published 2000
Springer US
Table of Contents:
“
...Technology -- Advanced Optoelectronics in
Optical
Fibre Sensors -- Interferometric Distance Sensors...
”
Read Now
36
Nitride Semiconductors and Devices
by
Morkoç, Hadis
Published 1999
Springer Berlin Heidelberg
Table of Contents:
“
...1. Introduction -- 2. General Properties of Nitrides -- 2.1 Crystal Structure of Nitrides --
2.2
...
”
Read Now
37
Micromachined Ultrasound-Based Proximity Sensors
by
Hornung, Mark R.
,
Brand, Oliver
Published 1999
Springer US
Table of Contents:
“
... Resonators -- 2.1 Resonant Behavior of Microstructures --
2.2
Excitation and Detection Principles -- 2.3...
”
Read Now
38
Rapid Reliability Assessment of VLSICs
by
Dorey, A.P.
,
Jones, B.K.
,
Richardson, A.M.D.
,
Xu, Y.Z.
Published 1990
Springer US
Table of Contents:
“
... Introduction --
2.2
Details of the Devices Studied -- 2.3 SPICE Circuit Files and Device Parameters -- 2.4...
”
Read Now
39
Analysis and Simulation of Semiconductor Devices
by
Selberherr, S.
Published 1984
Springer Vienna
Table of Contents:
“
... References -- 2. Some Fundamental Properties -- 2.1 Poisson’s Equation --
2.2
Continuity Equations -- 2.3...
”
Read Now
40
Polycrystalline Silicon for Integrated Circuit Applications
by
Kamins, Ted
Published 1988
Springer US
Table of Contents:
“
... -- 2.1 Nucleation --
2.2
Surface diffusion and structure -- 2.3 Evaluation techniques -- 2.4 Grain...
”
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