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language:"English"
dewey-ones:"620 - Engineering & allied operations"
author_facet:"Goldstein, Joseph"
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Practical Scanning Electron Microscopy : Electron and Ion Microprobe Analysis
Published 1975
Springer US
Subjects:
“
...
Characterization
and
Evaluation
of
Materials
...
”
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Scanning Electron Microscopy and X-Ray Microanalysis : Third Edition
by
Goldstein, Joseph
,
Newbury, Dale E.
,
Joy, David C.
,
Lyman, Charles E.
Published 2003
Springer US
Subjects:
“
...
Characterization
and
Evaluation
of
Materials
...
”
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620 - Engineering & allied operations
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Goldstein, Joseph
Joy, David C.
1
Lyman, Charles E.
1
Newbury, Dale E.
1
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