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2
by Land, C. M. van 't
Published 2018
John Wiley & Sons, Inc.
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3
by Marston, R. M.
Published 1996
Newnes
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4
by Ozenbaugh, Richard Lee
Published 2017
CRC Press
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5
by Rosa, José M. de la
Published 2018
John Wiley & Sons
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6
by Wikamowski, Bogdan M.
Published 2011
CRC Press
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7
by Jackman, Shawn M.
Published 2011
Wiley
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8
by Hurtarte, Jeorge S.
Published 2007
Newnes
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9
by Fant, Karl M.
Published 2005
John Wiley & Sons
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12
by Rosa, José M. de la, Río, R. del
Published 2013
Wiley-IEEE Press
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13
by Moore, Thomas M.
Published 1993
Butterworth-Heinemann
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14
by Balasinski, Artur
Published 2012
CRC Press
Table of Contents: “...1. Introduction -- 2. Migrating industrial DfM into IC manufacturing -- 3. IC DfM for devices...”
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15
Published 2006
Elsevier Morgan Kaufmann Publishers
Table of Contents: “... and fault simulation / Jiun-Lang Huang, James C.-M. Li, and Duncan M. (Hank) Walker -- Test generation...”
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16
Published 2023
Wiley
Table of Contents: “... / Rajeswari, N Vinod Kumar, K M Suresh, N Sai Kumar, K Girija Sravani -- A Detailed Roadmap from Conventional...”
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17
by Doğançay, Kutluyıl
Published 2008
Academic Press
Table of Contents: “...; Sequential-partial-update APA; Stochastic-partial-update APA; M -max APA; Selective-partial-update APA; Set...”
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18
by Stokes, Jon
Published 2007
No Starch Press
Table of Contents: “... -- Understanding caching and performance -- Intel's Pentium M, Core Duo, and Core Duo 2...”
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19
by Wang, Laung-Terng
Published 2009
Morgan Kaufmann Publishers/Elsevier
Table of Contents: “...Ch. 14. Fault Simulation and Test Generation / James C.-M. Li and Michael S. Hsiao...”
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20
by Wolf, Wayne
Published 2004
Morgan Kaufmann
Table of Contents: “.... Models of computation for systems-on-chips / JoAnn M. Paul and Donald E. Thomas -- 16. Metropolis : a...”