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1
by Ulrich, Ernst G., Agrawal, Vishwani D., Arabian, Jack H.
Published 1994
Springer US
Table of Contents: “... References -- 11 Concurrent Test Generation -- 11.1 Introduction -- 11.2 Fault Simulator Used as Test...”
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2
Published 1995
Springer US
Table of Contents: “... Where are we going with telecommunications development and regulation in the year 2000 and beyond? -- 61...”
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3
Published 1985
Springer Berlin Heidelberg
Table of Contents: “...Development of a Picosecond Cryo-Sampler Using Electro-Optic Techniques. (With 4 Figures...”