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dewey-ones:"621 - Applied physics"
language:"English"
product_txtF_mv:"Cambridge Books Online"
author_facet:"Wallis, T. Mitch"
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Measurement techniques for radio frequency nanoelectronics
by
Wallis, T. Mitch
,
Kaboš, P.
Published 2017
Cambridge University Press
Call Number:
TK6552.5
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