1 Table of Contents: “...Preface -- Chapter 1: Focused Ion Beam (FIB) technology for micro and nanoscale fabrications...”

2 Table of Contents: “... Copper -- 6.10. Access to Die Circuitry from the “Backside” -- 6.11. Secondary Ion Mass Spectrometry (Fib...”

3 Subjects: “...focused ion beam (FIB)...”

4 Subjects: “...focused ion beam-scanning electron microscopy (FIB-SEM)...”

5 Subjects: “...focused ion beam (FIB)...”

6 Subjects: “...focused ion beam (FIB)...”

7 Subjects: “...FIB...”

8 “...This thesis presents pioneering work in the relatively new field of focused ion beam (FIB...”

9 Table of Contents: “... -- Device and Doping Studies -- FIB, SEM and SPM Advances...”

10 Table of Contents: “... Films -- Conduction in in Atomic-Sized Magnetic Metallic Constructions created by FIB -- Pt-C Nanowires...”

11 Table of Contents: “... Diffraction -- In-Situ Materials Characterization with FIB/SEM -- In-situ X-ray photoelectron spectroscopy...”

12 Table of Contents: “... synchrotron radiation -- Nano characterization of structures by Focused Ion Beam (FIB) Tomography -- Atom...”

13 Table of Contents: “... Engineering -- Applications of FIB and DualBeam for Nanofabrication -- Nanowires and Carbon Nanotubes...”

14 “... devoted to acronyms and abbreviations. So if you think you know the meaning of ADDER, LAP, FIB, SPICE...”

15 “... diffraction, electron microscopy (SEM, FIB, TEM), and spectroscopy (EDS, WDS, EBSD) techniques. · 2D and 3D...”

16 “... of materials, such as computer tomography (CT), X-ray and neutron diffraction, electron microscopy (SEM, FIB...”

17 “... diffraction, electron microscopy (SEM, FIB, TEM), and spectroscopy (EDS, WDS, EBSD) techniques. · 2D and 3D...”

18 Table of Contents: “...9.4 Cross Section Decoration: Staining -- 9.5 Focused Ion Beam (FIB) Techniques -- 9.6 Sectioning...”

19 “... of materials, such as computer tomography (CT), X-ray and neutron diffraction, electron microscopy (SEM,FIB...”

20 Table of Contents: “...-Dimensional Orientation Microscopy by Serial Sectioning and EBSD-Based Orientation Mapping in a FIB-SEM...”