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"metrology" » "meteorology"

1
by Rumpf, Hans
Published 1975
Springer Netherlands
Table of Contents: ... solids -- 3 Fundamental physical processes and particle metrology -- 3.1 The motion of particles in a...

2
Published 1973
Springer US
Table of Contents: ... -- Superconducting Coils -- Physics of Superconducting Devices -- Superconductivity in DC Voltage Metrology...

3
Published 1999
Springer Netherlands
Table of Contents: ... to be resolved when applying bondgraphs -- Tolerance evaluation & computational metrology -- Tolerance evaluation...

4
Published 1987
Springer New York
Table of Contents: .... Problems -- A The Integer Effect -- 2 Experimental Aspects and Metrological Applications -- 3 Effects...

5
Published 1989
Springer Netherlands
Table of Contents: .... Brun, Stein Heurtey SA -- 5. Optimisation of Components -- 5.1. Testing Metrology M.S. Loveday...

6
Published 2002
Springer Netherlands
... evaluation, dynamic problems, fiber optic sensors, speckle metrology, digital image processing...

7
Published 1977
Springer US
Table of Contents: ... for Metrology and Standards -- 6: High Frequency Properties and Applications of Josephson Junctions from...

8
Published 1990
Springer New York
Table of Contents: .... Problems -- A The Integer Effect -- 2 Experimental Aspects and Metrological Applications -- 3 Effects...

9
by Layer, Edward
Published 2002
Springer Berlin Heidelberg
..., such as control, electrical engineering or electrical metrology. They are based on different mathematical fields...

10
Published 2002
Springer Netherlands
Table of Contents: ... of machining defects -- Formal Definition of Tolerancing in Cad and Metrology -- Quality Measurement on CMM...

11
Published 1994
Springer US
Table of Contents: ... of Biomaterials -- The Scanning Probe Microscope as a Metrology Tool -- Use of Atomic Force Microscopy...

12
by Thompson, Donald O., Chimenti, Dale E.
Published 1988
Springer US
Table of Contents: ...) Thermography -- Sub-Bandgap Laser Probing of GaAs Devices and Circuits -- Semiconductor Dimensional Metrology...