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dewey-ones:"620 - Engineering & allied operations"
language:"English"
product_txtF_mv:"Springer Book Archives -2004"
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1
Particle Technology
by
Rumpf, Hans
Published 1975
Springer Netherlands
Table of Contents:
“
... solids -- 3 Fundamental physical processes and particle
metrology
-- 3.1 The motion of particles in a...
”
Read Now
2
The Science and Technology of Superconductivity : Proceedings of a summer course held August 13–26, 1971, at Georgetown University, Washington, D.C.
Published 1973
Springer US
Table of Contents:
“
... -- Superconducting Coils -- Physics of Superconducting Devices -- Superconductivity in DC Voltage
Metrology
...
”
Read Now
3
Global Consistency of Tolerances : Proceedings of the 6th CIRP International Seminar on Computer-Aided Tolerancing, University of Twente, Enschede, The Netherlands, 22–24 March, 19...
Published 1999
Springer Netherlands
Table of Contents:
“
... to be resolved when applying bondgraphs -- Tolerance evaluation & computational
metrology
-- Tolerance evaluation...
”
Read Now
4
The Quantum Hall Effect
Published 1987
Springer New York
Table of Contents:
“
.... Problems -- A The Integer Effect -- 2 Experimental Aspects and
Metrological
Applications -- 3 Effects...
”
Read Now
5
Research and Development of High Temperature Materials for Industry
Published 1989
Springer Netherlands
Table of Contents:
“
.... Brun, Stein Heurtey SA -- 5. Optimisation of Components -- 5.1. Testing
Metrology
M.S. Loveday...
”
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6
Recent Advances in Experimental Mechanics : In Honor of Isaac M. Daniel
Published 2002
Springer Netherlands
“
... evaluation, dynamic problems, fiber optic sensors, speckle
metrology
, digital image processing...
”
Read Now
7
Superconductor Applications: SQUIDs and Machines
Published 1977
Springer US
Table of Contents:
“
... for
Metrology
and Standards -- 6: High Frequency Properties and Applications of Josephson Junctions from...
”
Read Now
8
The Quantum Hall Effect
Published 1990
Springer New York
Table of Contents:
“
.... Problems -- A The Integer Effect -- 2 Experimental Aspects and
Metrological
Applications -- 3 Effects...
”
Read Now
9
Modelling of Simplified Dynamical Systems
by
Layer, Edward
Published 2002
Springer Berlin Heidelberg
“
..., such as control, electrical engineering or electrical
metrology
. They are based on different mathematical fields...
”
Read Now
10
Integrated Design and Manufacturing in Mechanical Engineering : Proceedings of the Third IDMME Conference Held in Montreal, Canada, May 2000
Published 2002
Springer Netherlands
Table of Contents:
“
... of machining defects -- Formal Definition of Tolerancing in Cad and
Metrology
-- Quality Measurement on CMM...
”
Read Now
11
Atomic Force Microscopy/Scanning Tunneling Microscopy
Published 1994
Springer US
Table of Contents:
“
... of Biomaterials -- The Scanning Probe Microscope as a
Metrology
Tool -- Use of Atomic Force Microscopy...
”
Read Now
12
Review of Progress in Quantitative Nondestructive Evaluation : Volume 7B
by
Thompson, Donald O.
,
Chimenti, Dale E.
Published 1988
Springer US
Table of Contents:
“
...) Thermography -- Sub-Bandgap Laser Probing of GaAs Devices and Circuits -- Semiconductor Dimensional
Metrology
...
”
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Collection: Springer Book Archives -2004
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Classification
620 - Engineering & allied operations
Language
English
Collection
Springer Book Archives -2004
Author
Girvin, Steven M.
2
Prange, Richard E.
2
Bray, M.T.
1
Brunetaud, R.
1
Bullock, E.
1
Chedmail, Patrick
1
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Chimenti, Dale E.
1
Cognet, Gérard
1
Cohen, Samuel H.
1
Conde, J.F.
1
Fortin, Clément
1
Gdoutos, E.E.
1
Gregory, W.
1
Kals, Hubert
1
Keown, S.R.
1
Layer, Edward
1
Lightbody, Marcia L.
1
Mascle, Christian
1
Rumpf, Hans
1
Schwartz, Brian
1
Thompson, Donald O.
1
van Houten, Fred
1
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