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142
by Keller, H. J.
Published 1975
Springer US
Subjects: “...Electrical and Electronic Engineering...”
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143
Published 1997
Springer US
Subjects: “...Electrical and Electronic Engineering...”
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144
by Thomas, John B.
Published 1986
Springer New York
Subjects: “...Electrical and Electronic Engineering...”
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145
by Zhong-lin Wang, Kang, Z.C.
Published 1998
Springer US
Table of Contents: “... Structure Characterizations -- 6. Electron Crystallography for Structure Analysis -- 7. Structure Analysis...”
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146
Published 2001
Springer US
Subjects: “...Electrical and Electronic Engineering...”
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147
Published 1995
Springer Netherlands
Table of Contents: “... and Characterization of the Metal-semiconductor Micro/Nanostructures -- Electronic States in Quantum Wells...”
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148
by Deif, Assem
Published 1986
Springer Berlin Heidelberg
Subjects: “...Electrical and Electronic Engineering...”
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149
Published 2002
Springer US
Subjects: “...Electrical and Electronic Engineering...”
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150
Published 2002
Springer US
Table of Contents: “... -- On the ? – ? Overlap Energy in Carbon Nanotubes -- Electronic and Mechanical Properties of Carbon Nanotubes -- Low...”
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151
by Tzou, H.S.
Published 1993
Springer Netherlands
Subjects: “...Electrical and Electronic Engineering...”
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152
Published 2004
Springer Berlin Heidelberg
Table of Contents: “... Microscopy and High Resolution Non-Destructive Evaluation -- Vortex matter and superconducting electronic...”
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153
by Schropp, Ruud E.I., Zeman, Miro
Published 1998
Springer US
Table of Contents: “.... Deposition of Amorphous and Microcrystalline Silicon -- 3. Optical, Electronic and Structural Properties -- 4...”
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154
Published 2001
Springer Netherlands
Subjects: “...Electrical and Electronic Engineering...”
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155
by Li Lü, Fuh, J., Yoke-San Wong
Published 2001
Springer US
Subjects: “...Electrical and Electronic Engineering...”
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156
Published 1989
Springer Netherlands
Table of Contents: “... of alkali and alkali-earth halides by ions and electrons -- Effects of Ar+ angle-of-incidence on the etching...”
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157
Published 1991
Springer US
Table of Contents: “... in Scanning Electron Acoustic Microscopy of Ceramics -- Leaky Rayleigh Wave Inspection under Surface Layers...”
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158
Published 2003
Springer Berlin Heidelberg
Subjects: “...Electronic data processing / Management...”
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159
by Faraz, Ali, Payandeh, Shahram
Published 2000
Springer US
Subjects: “...Electrical and Electronic Engineering...”
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160
Published 2003
Springer US
Subjects: “...Electrical and Electronic Engineering...”