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1
Published 2001
Springer US
Table of Contents: “...1. Surface measurement and characterization -- 2. Fractal geometry in engineering metrology -- 3...”
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2
by Lucas, A.A., Cutler, Paul H., North, A.
Published 1983
Springer US
“... to the basic physics of recent spectacular advances achieved in the field of metrology and to the determination...”
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3
Published 1988
Springer Netherlands
Table of Contents: “... Relativity -- The Quantum Hall Effect Part I: Basic Experiments -- Quantum Hall Effect Part II: Metrological...”
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4
Published 2003
Springer Netherlands
Table of Contents: “...Schmidt-mode Analysis of Entanglement for Quantum Information Studies -- Quantum Metrology...”
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5
Published 2001
Springer Berlin Heidelberg
Table of Contents: “... -- Fundamental Constants and Frequency Metrology -- A New Type of Frequency Chain and Its Application...”
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6
by Planat, Michel
Published 2000
Springer Berlin Heidelberg
Table of Contents: “... -- Oscillators and the Characterization of Frequency Stability: an Introduction -- Phase Noise Metrology...”
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7
Published 1986
Springer US
Table of Contents: “... -- Spectral Sum Rules for Confinement Potentials -- Metrology of Space-Time Dimension -- Chronological...”
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8
Published 1999
Springer Berlin Heidelberg
Table of Contents: “...Semiconductor applications in metrology -- 125 years of metal-semiconductor contacts: Where do we...”
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9
by Friedman, Avner
Published 1997
Springer New York
Table of Contents: “...1 Dealing with geometric variations in manufacturing -- 1.1 Tolerancing -- 1.2 Metrology -- 1.3...”