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dewey-ones:"006 - Special computer methods"
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1
The Seneca Effect : Why Growth is Slow but Collapse is Rapid
by
Bardi, Ugo
Published 2017
Springer International Publishing
“
...The
Frontiers
Collection...
”
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2
Morphogenesis Deconstructed : An Integrated View of the Generation of Forms
by
Pismen, Len
Published 2020
Springer International Publishing
“
...The
Frontiers
Collection...
”
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3
Singularity Hypotheses : A Scientific and Philosophical Assessment
Published 2012
Springer Berlin Heidelberg
“
...The
Frontiers
Collection...
”
Read Now
4
Fault Diagnosis of Analog Integrated Circuits
by
Kabisatpathy, Prithviraj
,
Barua, Alok
,
Sinha, Satyabroto
Published 2005
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
5
Data Mining and Diagnosing IC Fails
by
Huisman, Leendert M.
Published 2005
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
6
The Core Test Wrapper Handbook : Rationale and Application of IEEE Std. 1500™
by
da Silva, Francisco
,
McLaurin, Teresa
,
Waayers, Tom
Published 2006
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
7
Timing Performance of Nanometer Digital Circuits Under Process Variations
by
Champac, Victor
,
Garcia Gervacio, Jose
Published 2018
Springer International Publishing
“
...
Frontiers
in Electronic Testing...
”
Read Now
8
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
by
Chakrabarty, Krishnendu
Published 2002
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
9
Testing Static Random Access Memories : Defects, Fault Models and Test Patterns
by
Hamdioui, Said
Published 2004
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
10
Efficient Branch and Bound Search with Application to Computer-Aided Design
by
Xinghao Chen
,
Bushnell, Michael L.
Published 1996
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
11
From Contamination to Defects, Faults and Yield Loss : Simulation and Applications
by
Khare, Jitendra B.
,
Maly, Wojciech
Published 1996
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
12
Test Resource Partitioning for System-on-a-Chip
by
Iyengar, Vikram
,
Chandra, Anshuman
Published 2002
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
13
Multi-Chip Module Test Strategies
Published 1997
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
14
Power-Constrained Testing of VLSI Circuits : A Guide to the IEEE 1149.4 Test Standard
by
Nicolici, Nicola
,
Al-Hashimi, Bashir M.
Published 2003
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
15
Frontiers and Progress in Multiphase Flow I
Published 2014
Springer International Publishing
“
...
Frontiers
and Progress in Multiphase Flow...
”
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16
New Directions in Empirical Translation Process Research : Exploring the CRITT TPR-DB
Published 2016
Springer International Publishing
“
...New
Frontiers
in Translation Studies...
”
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Classification: 006 - Special computer methods
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Classification
006 - Special computer methods
535 - Light & infrared & ultraviolet phenomena
2
Language
English
16
Collection
Springer eBooks 2005-
9
Springer Book Archives -2004
7
Author
Al-Hashimi, Bashir M.
1
Bangalore, Srinivas
1
Bardi, Ugo
1
Barua, Alok
1
Bushnell, Michael L.
1
Carl, Michael
1
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Chakrabarty, Krishnendu
1
Champac, Victor
1
Chandra, Anshuman
1
Cheng, Lixin
1
Eden, Amnon H.
1
Garcia Gervacio, Jose
1
Hamdioui, Said
1
Huisman, Leendert M.
1
Iyengar, Vikram
1
Kabisatpathy, Prithviraj
1
Khare, Jitendra B.
1
Maly, Wojciech
1
McLaurin, Teresa
1
Moor, James H.
1
Nicolici, Nicola
1
Pismen, Len
1
Schaeffer, Moritz
1
Sinha, Satyabroto
1
Soraker, Johnny H.
1
Steinhart, Eric
1
Waayers, Tom
1
Xinghao Chen
1
Zorian, Yervant
1
da Silva, Francisco
1
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