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1
by Pau, L.F.
Published 1990
Springer US
Table of Contents: “... -- 2. Imaging Microscopes for Microelectronics -- 3. Metrology in Electronic Devices and Substrates...”
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2
Published 1997
Springer Berlin Heidelberg
Table of Contents: “... authentication using fingerprints -- An algorithm for recognising walkers -- Metrological remote identification...”