1
by Wens, Mike, Steyaert, Michiel
Published 2011
Springer Netherlands
... is discussed, taking into account all the significant losses in CMOS technologies. This model allows very...

2
by van den Bosch, Anne, Steyaert, Michiel, Sansen, Willy M.C.
Published 2004
Springer US
.... Furthermore, a new closed formula has been derived to account for the influence of the transistor mismatch...

3
by Vereecken, Wim, Steyaert, Michiel
Published 2009
Springer Netherlands
... in an indoor environment. However, what is not accounted for in most high-level theoretical perspectives...