1
Published 1988
Springer Netherlands
Table of Contents: ... Function Correction in Electron Microscopy -- Climatically Induced Cyclic Variations in United States Crop...

2
Published 1988
Springer Netherlands
Subjects: ...Electrical and Electronic Engineering...

3
by Erickson, G., Rychert, Joshua T., Smith, C.R.
Published 1998
Springer Netherlands
Table of Contents: ... of the Charge Density from Elastic Electron Scattering Data -- Integrated Deformable Boundary Finding Using...