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1
Published 2015
Springer International Publishing
Table of Contents: “...From the Contents: Introduction -- 3D Force-Field Spectroscopy -- Simultaneous NC-AFM/STM...”
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2
Published 2009
Springer Berlin Heidelberg
Table of Contents: “...Method for Precise Force Measurements -- Force Spectroscopy on Semiconductor Surfaces -- Tip#x2013...”
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3
Published 2007
Springer Berlin Heidelberg
Table of Contents: “... Force Microscopy -- Magnetic Force Microscope -- STM-Induced Photon Emission Spectroscopy -- Scanning...”