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Metal-Dielectric Interfaces in Gigascale Electronics : Thermal and Electrical Stability
by
He, Ming
,
Lu, Toh-Ming
Published 2012
Springer New York
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Evolution of Thin Film Morphology : Modeling and Simulations
by
Pelliccione, Matthew
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Lu, Toh-Ming
Published 2008
Springer New York
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620 - Engineering & allied operations
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621 - Applied physics
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Language
English
2
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Springer eBooks 2005-
2
Author
Lu, Toh-Ming
He, Ming
1
Pelliccione, Matthew
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