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1
Published 2024
Springer Nature Switzerland
“... diffraction, electron microscopy (SEM, FIB, TEM), and spectroscopy (EDS, WDS, EBSD) techniques. · 2D and 3D...”
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2
Published 2021
Springer International Publishing
“... of materials, such as computer tomography (CT), X-ray and neutron diffraction, electron microscopy (SEM, FIB...”
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3
Published 2022
Springer International Publishing
“... of materials, such as computer tomography (CT), X-ray and neutron diffraction, electron microscopy (SEM,FIB...”
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4
Published 2019
Springer International Publishing
Table of Contents: “...Part 1. Characterization Methods -- On FIB Milling Parameters -- Part 2. Characterization...”
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5
Published 2018
Springer International Publishing
Table of Contents: “...Part 1. Characterization Methods -- On FIB Milling Parameters -- Part 2. Characterization...”